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LIV characteristic test protocol for photoelectricLIV, photoelectric characteristics, is a common way to verify the performance of laser diodes and detectors. To reduce production costs while increasing product throughput during wafer, cutting, tube core, and post-packaging buring-in tests, the fast and ...
Four probe method to measure semiconductor resistiResistivity is an important parameter to determine the electrical properties of semiconductor materials. In order to characterize the quality of the process and the doping of the materials, it is necessary to test the resistivity of the materials. There a...
IV, CV characteristic test scheme of power deviceResistivity is an important parameter to determine the electrical properties of semiconductor materials. In order to characterize the quality of the process and the doping of the materials, it is necessary to test the resistivity of the materials. There a...
Semiconductor Hall effect test scheme半导体材料的霍尔效应是表征和分析半导体材料的重要手段，可根据霍尔系数的符号判断材料的导电类型。霍尔效应本质上是运动的带电粒子在磁场中受洛仑兹力作用引起的偏转，当带电粒子(...
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